ITT - Research Scanning Electron Microscope
The procurement contact named on the official notice.
The submission route named on the official notice.
The National Physical Laboratory [NPL] requirement is for a Scanning Electron Microscope suitable for high resolution micro-structural characterisation of a wide range of samples.
Imaging capabilities should encompass ultra-high resolution of biological nanoparticles with dimensions of 10 nm through to image acquisition of regions > 10 mm in size through stitching of multiple images.
Conductive and non-conductive samples will require to be imaged and methods for charge dissipation without significant loss of resolution will be required.
The microscope is also required to be suitable for analytical measurements by Energy Dispersive X-ray Spectroscopy (EDX) and Electron Backscatter Diffraction (EBSD).
Detectors for these methods should be supplied as an integrated solution and the system must be capable of high beam current densities to enable these detectors to run at their highest possible rates whilst also maintaining capabilities for high resolution imaging with low beam currents.
It is also intended to use the microscope for in situ micromechanical testing, so the specification also includes the provision of a mechanical test stage suitable for testing of mm scale test samples, including heating to high temperatures.
What the supplier must deliver
Imaging capabilities should encompass ultra-high resolution
Imaging capabilities should encompass ultra-high resolution of biological nanoparticles with dimensions of 10 nm through to image acquisition of regions > 10 mm in size through stitching of multiple images.
Conductive and non-conductive samples will require
Conductive and non-conductive samples will require to be imaged and methods for charge dissipation without significant loss of resolution will be required.
The microscope is also required to
The microscope is also required to be suitable for analytical measurements by Energy Dispersive X-ray Spectroscopy (EDX) and Electron Backscatter Diffraction (EBSD).
Detectors for these methods should be supplied
Detectors for these methods should be supplied as an integrated solution and the system must be capable of high beam current densities to enable these detectors to run at their highest possible rates whilst also maintaining capabilities for high resolution imaging with low beam currents.
Derived from the notice text — always confirm against the original documents.
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- OCID
- ocds-h6vhtk-0369dc
- Stage
- tender · Open
- Source
- Find a Tender
- Buyer ref
- 026316-2022
Contains public sector information licensed under the Open Government Licence v3.0. Source data © Crown copyright.
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